From Education to Innovation — Building the Future of the U.S. Semiconductor Industry

Apr 1 – 2, 2026
Renaissance Atlanta Midtown Hotel
America/New_York timezone
Championing New Approaches to Reestablishing US Dominance in Semiconductors & Microelectronics

Growth of Scandium Diboride Semimetallic Single Crystals by Laser Floating Zone Method

Apr 2, 2026, 12:45 PM
20m
Room A

Room A

ORAL Materials & Devices - (c) Technical Session 3

Speaker

Ahamed Raihan (Morgan State University)

Description

Scandium diboride (ScB2) is a refractory semi-metallic ultrahard ceramic crystal that is lattice matched to ultra-wide bandgap (UWBG) AlGaN. The lattice match of ScB2/Al0.55Ga0.45N would reduce the strain and crystal defects of epitaxial layers enabling thicker pseudomorphic drift layers >5um for high voltage vertical power devices >5kV on these semi-metallic substrates, while eliminating the substrate series resistance parasitic.
We demonstrate the growth of ScB2 crystals by the laser-diode floating zone (LDFZ) method. Poly-crystalline ScB2 rods were used as our feed and seed rods, and Sc as flux, with a starting resistivity of ~400μΩcm. Our growth rate is ~2mm/hr giving a typical total growth of >20mm long. X-Ray Diffraction (XRD) data shows clear signatures of (001) ScB2. Laue measurements on cut/polished samples show six-fold symmetry over mm length scales, with room temperature bulk resistivity ~20μΩ-cm, ~20x lower than the starting feed material. Heat-capacity measurements were performed at temperatures 2K<T<300 K and were analyzed to quantify the contributions of phonons and electrons. The Debye temperature (θD~710K) and the electronic coefficient (γ ~ 3.8 mj.mol^(-1).K^(-2)) of heat capacity Determined. These samples had thermal conductivity ~100 W/m-K at the level of Si and GaN, showing the potential for substrates from an electrothermal co-design perspective.

Academic or Professional Status Graduate Student

Author

Ahamed Raihan (Morgan State University)

Co-authors

Mr Astrid Dzotcha Kengne (Center for Research and Education in Microelectronics, Department of Electrical and Computer Engineering, Morgan State University, Baltimore, MD 21251, United States) Mr Daniel Joel Harrison (Center for Research and Education in Microelectronics, Department of Electrical and Computer Engineering, Morgan State University, Baltimore, MD 21251, United States) Mr Evan N. Crites (Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218, USA) Dr Fnu Shipra (Center for Research and Education in Microelectronics, Department of Electrical and Computer Engineering, Morgan State University, Baltimore, MD 21251, United States) Prof. MVS Chandrashekhar (Center for Research and Education in Microelectronics, Department of Electrical and Computer Engineering, Morgan State University, Baltimore, MD 21251, United States) Prof. Michael G. Spencer (Center for Research and Education in Microelectronics, Department of Electrical and Computer Engineering, Morgan State University, Baltimore, MD 21251, United States) Dr Satya Kushwaha (Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218, USA) Prof. Tyrel M. McQueen (Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218, USA)

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