Speaker
Description
Two-dimensional (2D) ferroelectric materials are promising candidates for next-
generation nanoelectronic and non-volatile memory devices. Reliable
electrical characterization at the nanoscale remains challenging. In this work, we
investigate the ferroelectric properties of layered CuInP₂S₆ (CIPS) using a modified
conductive atomic force microscopy (C-AFM) approach. CIPS flakes were
mechanically exfoliated onto a conducting gold (Au) substrate, followed by the transfer
of few-layer graphene (FLG) on top, forming an Au/CIPS/FLG van der Waals
heterostructure. Au serves as the bottom electrode, FLG acts as
the top contact, and CIPS functions as the ferroelectric layer. Due to the small lateral
dimensions of the FLG electrode, a conducting AFM tip was employed to establish a
precise electrical connection to the FLG, enabling localized ferroelectric
measurements. The conducting tip was interfaced with a ferroelectric tester to probe
the electrical response of the heterostructure. Frequency-dependent polarization–
electric field (P–E) hysteresis loops were measured under various electric field
sweeps, along with current–voltage characteristics. Additionally, positive-up–negative-
down (PUND) measurements were performed to distinguish intrinsic ferroelectric
switching from non-ferroelectric contributions. The observed hysteresis behavior and
PUND response confirm the intrinsic ferroelectric nature of 2D CIPS and demonstrate
the effectiveness of the modified C-AFM technique for probing nanoscale
ferroelectricity.
| Academic or Professional Status | Undergraduate Student |
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